报告主题Title：Telling ‘Who is Who’ at Atomic Scale - STM & XPS & DFT – Powerful Tools for Surface Science(原子尺度表面科学的STM & XPS & DFT研究)
报告人Speaker：Tianchao Niu, Center For Fucntional Nanomaterials, Brookhaven National Laboratory(布鲁克海文国家实验室)
报告时间Time：2017年2月15日 (周三) 15:30
报告地点Venue：校本部G309
邀请人：任伟教授
主办部门：永利物理系
报告摘要：Abstract: In this talk, I will briefly summarize recent progress in scanning tunneling microscopy study on single molecules of phthalocyanine on metal surfaces and the growth mechanism of graphene on different substrates, including Cu(111) and Ge(110). (1)We found the dipole alignment dependent symmetry reduction of the Cl-AlPc, the Cl-down adsorbed molecules can be reversibly switched under the nonuniform electric field between the STM tip and the molecule. (2) By combined in-situ CVD, STM, and DFT, we revealed the reaction intermediates of graphene growth on Cu(111) including the carbon clusters, defective graphene; (3) Control experiments of annealing the CVD graphene/Ge(110) in UHV and H2, shows the presence of hydrogen between Ge and graphene. The hydrogen stabilized 1 by 1 phase ensures the lattice registry between graphene and Ge(110), and the final single crystal graphene growth.
